Automatic Stability Checking for Large, Linear Analog Integrated Circuits
Parijat Mukherjee Texas A&M Univ., College Station, TX G. Peter Fang Texas Instruments, Inc., Tuscon, AZ Rod Burt Texas Instruments, Inc., Tuscon, AZ Peng Li Texas A&M Univ., College Station, TX
Pattern-Based Physical Verification in the Design Flow
Cristopher Magalang GLOBALFOUNDRIES, Singapore Valerio Perez GLOBALFOUNDRIES, Singapore Edward Teoh GLOBALFOUNDRIES, Singapore Rainer Mann GLOBALFOUNDRIES, Singapore Vito Dai GLOBALFOUNDRIES, Singapore Sky Yeo GLOBALFOUNDRIES, Singapore Colin Hui GLOBALFOUNDRIES, Singapore
DAC 59
July 10-14, 2022 San Francisco
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